Description
Product ID: | 9781466575301 |
Product Form: | Paperback / softback |
Country of Manufacture: | US |
Series: | Chapman & Hall/CRC Innovations in Software Engineering and Software Development Series |
Title: | Software Test Attacks to Break Mobile and Embedded Devices |
Authors: | Author: Jon Duncan Hagar |
Page Count: | 378 |
Subjects: | Digital and information technologies: Legal aspects, Legal aspects of IT, Software Engineering, Computer security, Computer science, Software Engineering, Computer security, Computer science |
Description: | Select Guide Rating This book presents an attack basis for testing mobile and embedded systems in "smart" devices. It explains patterns and techniques ranging from simple mind mapping to sophisticated test labs. For traditional testers moving into the mobile and embedded area, the book bridges the gap between IT and mobile/embedded system testing. It illustrates how to apply both traditional and new approaches. For those working with mobile/embedded systems without an extensive background in testing, the book brings together testing ideas, techniques, and solutions that are immediately applicable to testing smart and mobile devices. Address Errors before Users Find Them The book guides you step by step starting with the basics. It explains patterns and techniques ranging from simple mind mapping to sophisticated test labs. For traditional testers moving into the mobile and embedded area, the book bridges the gap between IT and mobile/embedded system testing. It illustrates how to apply both traditional and new approaches. For those working with mobile/embedded systems without an extensive background in testing, the book brings together testing ideas, techniques, and solutions that are immediately applicable to testing smart and mobile devices. |
Imprint Name: | CRC Press Inc |
Publisher Name: | Taylor & Francis Inc |
Country of Publication: | GB |
Publishing Date: | 2013-09-25 |