Description
| Product ID: | 9780128192542 |
| Product Form: | Paperback / softback |
| Country of Manufacture: | NL |
| Series: | Woodhead Publishing Series in Electronic and Optical Materials |
| Title: | Reliability of Semiconductor Lasers and Optoelectronic Devices |
| Authors: | Author: Osamu Ueda, Robert Herrick |
| Page Count: | 334 |
| Subjects: | Materials science, Materials science, Electrical engineering, Electronics and communications engineering, Electronic devices and materials, Applied optics, Laser technology and holography, Electrical engineering, Electronics & communications engineering, Electronic devices & materials, Applied optics, Laser technology & holography |
| Description: | Select Guide Rating Reliability of Semiconductor Lasers and Optoelectronic Devices simplifies complex concepts of optoelectronics reliability with approachable introductory chapters and a focus on real-world applications. This book provides a brief look at the fundamentals of laser diodes, introduces reliability qualification, and then presents real-world case studies discussing the principles of reliability and what occurs when these rules are broken. Then this book comprehensively looks at optoelectronics devices and the defects that cause premature failure in them and how to control those defects. Key materials and devices are reviewed including silicon photonics, vertical-cavity surface-emitting lasers (VCSELs), InGaN LEDs and lasers, and AlGaN LEDs, covering the majority of optoelectronic devices that we use in our everyday lives, powering the Internet, telecommunication, solid-state lighting, illuminators, and many other applications. This book features contributions from experts in industry and academia working in these areas and includes numerous practical examples and case studies.This book is suitable for new entrants to the field of optoelectronics working in R&D. |
| Imprint Name: | Woodhead Publishing |
| Publisher Name: | Elsevier Science Publishing Co Inc |
| Country of Publication: | GB |
| Publishing Date: | 2021-03-11 |
