Use coupon code “WINTER20” for a 20% discount on all items! Valid until 30-11-2024

Site Logo
Search Suggestions

      Royal Mail  express delivery to UK destinations

      Regular sales and promotions

      Stock updates every 20 minutes!

      Critical AI: A Field in Formation

      2 in stock

      Firm sale: non returnable item
      SKU 9781478024620 Categories ,
      Select Guide Rating
      This issue provides an overview of the emerging interdisciplinary field of Critical AI, which seeks to demystify artificial intelligence; counter its mythologizing as a marvelous and impenetrable black box; and translate, interpret, and critique its operations, from data colle...

      £11.99

      Buy new:

      Delivery: UK delivery Only. Usually dispatched in 1-2 working days.

      Shipping costs: All shipping costs calculated in the cart or during the checkout process.

      Standard service (normally 2-3 working days): 48hr Tracked service.

      Premium service (next working day): 24hr Tracked service – signature service included.

      Royal mail: 24 & 48hr Tracked: Trackable items weighing up to 20kg are tracked to door and are inclusive of text and email with ‘Leave in Safe Place’ options, but are non-signature services. Examples of service expected: Standard 48hr service – if ordered before 3pm on Thursday then expected delivery would be on Saturday. If Premium 24hr service used, then expected delivery would be Friday.

      Signature Service: This service is only available for tracked items.

      Leave in Safe Place: This option is available at no additional charge for tracked services.

      Description

      Product ID:9781478024620
      Product Form:Paperback / softback
      Country of Manufacture:GB
      Title:Critical AI
      Subtitle:A Field in Formation
      Authors:Author: Jennifer Rhee, Rita Raley
      Page Count:250
      Subjects:Literature: history and criticism, Literature: history & criticism, Media studies, Artificial intelligence, Media studies, Artificial intelligence
      Description:Select Guide Rating
      This issue provides an overview of the emerging interdisciplinary field of Critical AI, which seeks to demystify artificial intelligence; counter its mythologizing as a marvelous and impenetrable black box; and translate, interpret, and critique its operations, from data collection and model architecture to decision making. Artists and researchers are developing new methods, practices, and concepts for this critical project, which is both historicist and attentive to the institutional, technological, and epistemic transformations still underway. Contributors to this special issue collectively articulate and evince just such a critical approach to AI, one that combines humanistic and technical inquiry in its exploration of disciplinary and epistemological questions on the one hand, and the techniques of machine learning on the other. Featured contributions articulate some of the social, cultural, and ethicopolitical dimensions of machine learning in domains such as ecologies, art, poetics, race, warfare, pedagogy, and speculative fiction. Contributors. Ranjodh Singh Dhaliwal, Evan Donahue, Michele Elam, Seb Franklin, Christopher Grobe, N. Katherine Hayles, Tung-Hui Hu, Patrick Jagoda, Melody Jue, Fabian Offert, Rita Raley, Jennifer Rhee, R. Joshua Scannell, J.D. Schnepf, Tyler Shoemaker, Avery Slater, Luke Stark, Lindsay Thomas, Sherryl Vint
      This issue provides an overview of the emerging interdisciplinary field of Critical AI, which seeks to demystify artificial intelligence; counter its mythologizing as a marvelous and impenetrable black box; and translate, interpret, and critique its operations, from data collection and model architecture to decision making. Artists and researchers are developing new methods, practices, and concepts for this critical project, which is both historicist and attentive to the institutional, technological, and epistemic transformations still underway. Contributors to this special issue collectively articulate and evince just such a critical approach to AI, one that combines humanistic and technical inquiry in its exploration of disciplinary and epistemological questions on the one hand, and the techniques of machine learning on the other. Featured contributions articulate some of the social, cultural, and ethicopolitical dimensions of machine learning in domains such as ecologies, art, poetics, race, warfare, pedagogy, and speculative fiction.

      Contributors. Ranjodh Singh Dhaliwal, Evan Donahue, Michele Elam, Seb Franklin, Christopher Grobe, N. Katherine Hayles, Tung-Hui Hu, Patrick Jagoda, Melody Jue, Fabian Offert, Rita Raley, Jennifer Rhee, R. Joshua Scannell, J.D. Schnepf, Tyler Shoemaker, Avery Slater, Luke Stark, Lindsay Thomas, Sherryl Vint
      Imprint Name:Duke University Press
      Publisher Name:Duke University Press
      Country of Publication:GB
      Publishing Date:2023-07-31

      Additional information

      Weight412 g
      Dimensions152 × 235 × 15 mm